4D engineers and scientists are transforming how and where interferometry is used in research and manufacturing. Below is a selection of white papers, published articles and application notes from our 4D team.
New Measuring High NA Optical Systems Without Retrace Error, Sept. 2008 (388k) View PDF
Novel Interferometer Enables Challenging Measurements, April 2008 (346k) View PDF
Optical Metrology for Large Telescope Optics, February 2008 (382k) View PDF
Improved Interferometric Optical Testing, July 2007 (453k) View PDF
Pixelated mask spatial carrier phase shifting interferometry algorithms and associated errors - Brad Kimbrough, Applied Optics Vol. 45, No. 19, July 2006 (942k) View PDF
Low Coherence Vibration Insensitive Fizeau Interferometer - Brad Kimbrough, James Millerd, James Wyant, John Hayes, Proceedings of SPIE Vol. 6292, 2006 (490k) View PDF
Getting Rid of the Jitters - John Hayes and James Millerd, Photonics Handbook, 2006 (540k) View PDF
Going Through A Phase - James C. Wyant, SPIE OE Magazine, August, 2005 (513k) View PDF
Dynamic Phase-Shifting Electronic Speckle Pattern Interferometer - Michael North Morris, et. al. presented at SPIE August, 2005 (432k) View PDF
Pixelated phase-mask dynamic interferometer - James Millerd, et al. presented at SPIE August 2004 (848k) View PDF
Phase-shifting multi-wavelength dynamic interferometer - Michael North Morris, et al. presented at SPIE August, 2004 (302k) View PDF
Instantaneous phase shift point diffraction interferometer - James Millerd, et. al. presented at Optical Data Storage 2003 (200k) View PDF
Overcoming the fringe jitters - Stephen Martinek, SPIE OE Magazine, February, 2003 (786k) View PDF
Figure testing of 300 mm Zerodur mirrors at Cryogenic temperatures - J.W. Baer and W.P. Lotz, presented at SPIE 2002 (294k) View PDF
Dynamic interferometry handles vibration - John Hayes - Laser Focus World, March 2002 (147k) View PDF
Advances in Interferometric Metrology - James C. Wyant (452k) View PDF
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