4Sight offers a complete analysis software package for interferometry and laser interferometers, including: slope (X,Y, Magnitude), histograms, diffraction analysis (MTF, PSF, PSD, and Autocovariance) and geometric analysis (spot diagrams, encircled, and ensquared energy diagrams.). Powerful Zernike analysis includes both Zernike worksheet and Zernike table output screens. Flexible detector, analysis, terms, and pupil mask options makes it easy to achieve sub-aperture analysis over complex regions. Thoughtful details include multiple island leveling, multiple integration algorithms, unit conversions, user pupil definition, and much more. Custom analyses serve particular applications for even greater utility.
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The Measurement Stack lets you combine and manipulate multiple data sets with unparalleled simplicity. |
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Comprehensive Zernike analysis, including both worksheet and table screens, makes it easy to work with Zernike polynomials. |
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Full Fourier Analysis, includes PSF, MTF, AutoCovariance, and power spectral analysis. |
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Quality Control screen for single page statistical analysis of multiple measurements, with no programming needed |
Tel: +1 (520) 294-5600