520-294-5600 4dinfo@nanometrics.com

Diffuse surfaces

Electronic Speckle Pattern Interferometry (ESPI) measures the change in shape of structures with diffuse surfaces. TThe Rapid data acquisition permits accurate testing and quality control on the production floor, without the need for costly vibration isolation hardware, in applications including automotive, aerospace and materials research .

The PhaseCam 6100 Electronic Speckle Pattern Interferometer (ESPI) measures the change in shape of structures with diffuse surfaces up to several meters in diameter. Rapid data acquisition permits accurate testing and quality control on the production floor, without the need for costly vibration isolation hardware.

With the PhaseCam ESPI, a baseline measurement is made, then subsequent measurements are compared to it to determine deformation. Measurements can be made synchronously or asynchronously with respect to object motion. For measurement of vibrational deformation, synchronous capture can examine changes over a wide frequency and phase spectrum.

Added Technical Resources

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Measuring dynamic displacement of specular and diffuse components

A paper presenting a single-frame acquisition for measuring dynamic displacement of both specular and diffuse components, by freezing the motion of the test articles and measuring the dynamic nature of the surface figure under changing stress. Describes an ESPI dynamic interferometer.

Citation: Optical Inspection and Metrology for Non-Optics Industries, edited by Peisen S. Huang,
Toru Yoshizawa, Kevin G. Harding, Proc. of SPIE Vol. 7432, 74320W · © 2009
SPIE · CCC code: 0277-786X/09/$18 · doi: 10.1117/12.827090
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Dynamic Phase-shifting Electronic Speckle Pattern Interferometer

An overview of the techniques and configurations used to build dynamic interferometers and measurement results for a variety of space-based optical components as well as the structures that hold them under simulated space-flight conditions. These techniques and configurations have applicability for many non-space applications as well.

Citation:
Michael North Morris, James Millerd, Neal Brock, John Hayes, and Babak Saif “Dynamic phase-shifting electronic speckle pattern interferometer”, Proc. SPIE 5869, Optical Manufacturing and Testing VI, 58691B (18 August 2005); doi: 10.1117/12.620619; https://doi.org/10.1117/12.620619

Products for Diffuse Surfaces

PhaseCam ESPI

The PhaseCam 6100 Electronic Speckle Pattern Interferometer (ESPI) measures the change in shape of structures with diffuse surfaces up to several meters in diameter.

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