This is a no cost 1-day workshop.
Learn what is possible with the latest non-contact measurement technologies. Experience a range of state-of-the-art instruments and software from top manufacturers.
Dr. Erik Novak will be presenting "Polarized Light Portable Surface Profiling (1um)", 2:30 PM.
4D invites you to join us on Tuesday, January 10 for a webinar discussing surface roughness measurement on large optics.
Determining the roughness of large optics during polishing and after coating is challenging. Measuring optical grade roughness requires a high resolution metrology system such as an optical profiler. But typical optical profilers need extensive vibration isolation, and they lack sufficient clearance to measure large components. Inspectors must create replicas of portions of the large surface which can then be measured—a messy and time consuming process which provides only sparse data.
A dynamic optical profiler is able to measure surface roughness across the entire surface of optics and precision surfaces. A dynamic system measures thousands of times faster than traditional profilers, making it possible to measure despite vibration, which enables handheld use, or mounting directly in polishing equipment.
In this webinar we will discuss Dynamic Interferometry® technology and its advantages for non-contact measurement of large optical grade surfaces. We will show how a dynamic profiler can be used to measure on-optic or in situ in polishing equipment for vastly improved assessment of roughness before and after coating.
The webinar will take place January 10 at 2:00pm Eastern Standard Time (19:00 GMT).
Register today to learn about using dynamic optical profilers for measuring precision surfaces. The webinar will include a half-hour presentation followed by a question and answer period.
Precision components for aerospace, automotive, and other applications must be inspected throughout production for damage, and throughout their life span for wear, corrosion and defects.
Inspectors face challenges in determining the severity of defects and the depth of desired features such as laser marking or dot peening. Visual comparison techniques are quick and inexpensive but are subjective and not repeatable. More accurate metrology systems are typically too expensive, slow and susceptible to environmental factors for use on the shop floor.
The 4D InSpec Surface Gauge is the first handheld, precision instrument for non-contact measurement of surface features and defects, with micrometer-level resolution. The gauge measures defects from 0.1 to 100 mils deep, even in difficult-to-access areas such as under flanges, in bores and on curved surfaces. Measurements take just seconds, with instant results and reporting.
In this webinar we will discuss the Polarized Structured Light (PSL) technology behind the 4D InSpec Surface Gauge. We will demonstrate how the 4D InSpec can be used to measure surface features on large components and in difficult to access areas, as well as to make repeatable QA/QC measurements on production parts.
The webinar will take place Thursday, Jan 19, 2017 1:00PM - 2:00PM EST (18:00 GMT).
Arizona Commerce Authority Booth B2.135/3.
Soliton Booth, Number B2.415.
Booth 7G23 (Arizona Pavilion).
Join us for an overview of dynamic interferometry and dynamic surface profiling for precision measurement in a wide range of environments and applications. Learn how these technologies can help solve process control and quality measurement challenges, both in the metrology lab and on the production floor.
This free, one-day course will focus on the applications and advantages of dynamic measurement, followed by an afternoon, hands-on session with dynamic instruments. Breakfast and lunch are included for this free event.
Do you need to dramatically reduce scrap and rework of precision machined parts? We can help. Attend 4D Technology's "Simple, 3D Shop Floor Measurement Reduces Part Rejection" webinar on Thursday, January 11, 1:00 pm EST (18:00 GMT) to learn about new methods for affordable, high resolution, shop-floor surface defect and feature measurement.
With Indicate Technologies
With OptoScience and Enable KK
Hall 3.0 Booth G41
Hall 4.2 Stand D62
Dr. Michael North Morris, 4D Sr. Director of Product Development, will present "Applications of Short Coherence Sources in Fizeau Interferometry"
On-line Registration: www.ossc.org or
Contact Don Silbermann, OSSC Arrangements Chair, Events@ossc.org,(949) 636-6170
RSVP by June 10, 2018
Hall 9 Stand 9I09
Booth 122007, East Building Level 2
4D Technology will be closed for the US Thanksgiving Holiday. Best wishes to you and yours.
4D Technology will be closed on Christmas Day. We're wishing you Happy Holidays, and peace, prosperity and success in the new year.