NanoCam Sq Optical Profilers

Compact, Vibration-Immune Roughness Measurement

The NanoCam Sq dynamic optical profiler measures surface roughness on supersmooth optics and precision surfaces. Non-contact and lightweight, the NanoCam Sq is a vast improvement over messy replication methods required with traditional workstation optical profilers. The compact measurement head is highly flexible, letting you sample the entire surface of large optics and measure all the way to the corners of hexagonal mirror segments.

The NanoCam Sq lets you measure roughness directly in a polishing station. Measuring in situ greatly increasing throughput and reduces measurement cycle time. It also eliminates the risk of damage that comes with transporting expensive, mission-critical hardware.

NanoCam Sq Description

The NanoCam Sq optical profilometer utilizes Dynamic Interferometry^®, with a high-speed optical sensor that measures thousands of times faster than traditional profilers. Because acquisition time is so short, the NanoCam Sq can measure despite vibration, making it possible to mount the instrument on a gantry or robot end effector as well as inside of a polishing station.

Applications for NanoCam Sq optical profilers include surface roughness of small and large coated/uncoated optics, on-machine surface roughness metrology, and process control for polishing operations.

All NanoCam Sq Dynamic Optical Profilers include 4Sight advanced analysis software. Industry-leading 4Sight software reports ISO 25178 surface roughness parameters (S parameters) and provides extensive 2D and 3D analysis options, data filtering, masking and import/export functions.

NanoCam Sq Specs

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NanoCam Sq Specs

What to expect

The compact, lightweight NanoCam Sq measurement head measures just 9.6 x 9.6 x 3.3 inches and weighs less than 10 pounds, making it very easy to position for roughness measurement. Acquisition time of 100 µsec enables measurement despite noise and vibration. Multiple mounting options include a motorized, joystick controlled tripod, mobile workstation, and interfaces to polishing equipment, gantries or robots. Interference objectives provide magnifications from 0.9X through 50X, with an optional 2X magnification multiplier. Each objective can measure samples with reflectivity from 1% to 100% without changing reference optics.

Portable Roughness Measurement for Small Optics
3D Surface Roughness on Large Optics
On-Machine Polishing Metrology

4D supplies a turnkey interferometric system:

Interferometer Mainframe
Advanced software for taking measurements and analyzing the results
Complete computer system
Connecting cables and power supplies

Accessories include:

Multi-axis mounting and aligning the mainframe
Optical mounts
Reference optics
Diverging lenses for varying the beam shape
ESPI accessory for

4Sight wavefront analysis software features a user-friendly interface with unmatched simplicity, analysis features and graphical displays.

The measurement functions assist in alignment and measurement execution, and set-up of masking, reference subtraction, terms removal, and similar matters.

Data analysis functions such as Zernike, Seidel, geometric and diffraction analysis are easy to perform.

Share your data across many analysis applications, such as MatLab and CodeV.

Highlighted Features

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Compact and Lightweight

Measure roughness anywhere on large optics, mirror segments or small optics

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Versatile

Excellent light efficiency of the system, it’s possible to measure surfaces with reflectivity from 1% to 100%.

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Vibration Immune

Acquisition speeds as fast as 100 microseconds let the NanoCam Sq measure on robots, on gantries or in polishing stations.

data

analysis software

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Roughness and Finish

View our application page on surface roughness measurement.

Measuring Segmented Mirrors

Read about measuring segmented mirrors on our application page.

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