The NanoCam Sq dynamic optical profiler measures surface roughness on supersmooth optics and precision surfaces. The non-contact NanoCam Sq is a vast improvement over the messy replication methods required with traditional workstation optical profilers and provides excellent portability for measuring large optics.
By enabling on-machine roughness metrology the NanoCam Sq increases throughput. By eliminating the need to transport expensive, mission-critical optics, NanoCam reduces the risk of damage.
The NanoCam Sq optical profilometer utilizes Dynamic Interferometry®, incorporating a high-speed optical sensor that measures thousands of times faster than traditional optical profilers. Because acquisition time is so short, the NanoCam Sq can measure despite vibration, making it possible to mount the instrument in polishing equipment, on a gantry or on a robot end effector.
The NanoCam Sq is compact and lightweight enough to be placed directly on large optics. With this freedom of positioning the NanoCam can measure surface finish at any location on a large optic.
Applications for the NanoCam Sq optical profiler include surface roughness of small and large coated/uncoated optics, on-machine surface roughness metrology, and process control for polishing operations.
The NanoCam Sq Dynamic Optical Profiler includes 4Sight advanced analysis software. Industry-leading 4Sight reports ISO 25178 surface roughness parameters (S parameters) and provides extensive 2D and 3D analysis options, data filtering, masking, database and import/export functions.
NanoCam Sq optical profiler with optional mobile workstation.
NanoCam Sq measuring surface roughness of large mirror. Courtesy Optical Surface Technologies, Albuquerque, NM.
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Dynamic Interferometry
4D's patented wavefront sensors enable vibration insensitive Dynamic Interferometry. US Patents 6,304,330, 6552,808, 7,230,717, others. Other patents pending.
4D Technology dynamic laser interferometers use proprietary, high speed, high resolution wavefront sensors to measure the shape of optical surfaces with extreme accuracy despite vibration and environmental noise.
In a conventional phase-shifting laser interferometer, multiple frames of data are acquired over many milliseconds—enough time for vibration and turbulence to degrade the measurement results. In a dynamic interferometer, all phase data is acquired simultaneously, in as little as thirty microseconds. This speed enables 4D dynamic interferometers to measure in noisy environments, despite vibration solation or air turbulence.
Dynamic interferometry® enables complex tests between multiple unisolated tables, measurements in environmental chambers, and measurements with long stand-off distances. Odd shapes, pupil obscurations, poor signal contrast, moving parts, air turbulence and mechanical vibration are not problems. Special wavefront sensors have also been developed for wavelength insensitivity, higher spatial resolution, and applications within tight space restrictions.
