Quantify defects on films, optics and substrates.

FlexCam

FlexCam optical surface profiler, measure surface textureThe FlexCam provides high resolution 3D metrology in a highly compact package. FlexCam can be used as an affordable, stand-alone solution for in situ measurement of surface roughness or defects on large optics, such as glass windows or films. Its ability to scan large areas and accumulate statistics over the entire surface provides unparalleled surface quality data.

For flexible electronics, FlexCam enables real-time monitoring and control of roughness to less than 0.5nm rms, both inclusive of and exclusive of defects on the film. The system provides accurate measurement despite runout, web flutter, and other effects which can vary the relative location of the substrate with respect to the measurement system. No other system can match its performance.

Prism Award 2016 winnerFlexCam also identifies and quantifies defects, registering their position within the roll. Multiple defect statistics are calculated including area, volume, depth and slope, with user-selectable pass/fail criteria as each metric can have adverse effects on barrier or end device performance. Extrinsic versus intrinsic defects can be discriminated to help isolate their root cause. Where bright-field inspection systems are sensitive to the backside of the film as well as the roller surface, 4D’s FlexCam is immune to such effects, measuring only the top surface.

FlexCam optical surface profiler, measure surface roughnessEvery FlexCam module provides thousands of times more areal coverage than off-line bright-field or 3D microscopes. Each FlexCam module can provide 100% inspection in the machine direction for web speeds up to 1 m/minute. In addition, FlexCam modules can be arrayed across a web, offering as little or as much sampling in the transverse direction as required.

Each module processes all data on-board, calculating and reporting statistics in real-time, for incredible processing speed. In production mode, simple controls and pass/fail criteria make it easy to monitor the process. In engineering mode, 2D analyses, statistics and visualization tools help you quickly dial in process parameters and examine individual defects with high fidelity.

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