The NanoCam Sq dynamic optical profiler measures surface roughness on supersmooth optics and precision surfaces. The non-contact NanoCam Sq is a vast improvement over the messy replication methods required with traditional workstation optical profilers and provides excellent portability for measuring large optics.
By enabling on-machine roughness metrology the NanoCam Sq increases throughput. By eliminating the need to transport expensive, mission-critical optics, NanoCam reduces the risk of damage.
The NanoCam Sq optical profilometer utilizes Dynamic Interferometry®, incorporating a high-speed optical sensor that measures thousands of times faster than traditional optical profilers. Because acquisition time is so short, the NanoCam Sq can measure despite vibration, making it possible to mount the instrument in polishing equipment, on a gantry or on a robot end effector.
The NanoCam Sq is compact and lightweight enough to be placed directly on large optics. With this freedom of positioning the NanoCam can measure surface finish at any location on a large optic.
Applications for the NanoCam Sq optical profiler include surface roughness of small and large coated/uncoated optics, on-machine surface roughness metrology, and process control for polishing operations.
The NanoCam Sq Dynamic Optical Profiler includes 4Sight advanced analysis software. Industry-leading 4Sight reports ISO 25178 surface roughness parameters (S parameters) and provides extensive 2D and 3D analysis options, data filtering, masking, database and import/export functions.